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Align the Laser

This section describes two methods for aligning the laser for all AFM modes (recall, STM does not use a laser feedback mechanism). The first method uses the optional Optical Viewing Microscope (OMV) and requires that the sample be reflective. The second method is a “projection” method, useful for non-reflective samples and for users who do not have the OMV system.

Method 1: Optical Method
Method 2: The Projection Method
Etched Silicon Probes (TappingMode)
Silicon Nitride Probes (Contact Mode AFM)

 

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